Non-volatile memory device

ABSTRACT

A non-volatile memory device includes a first sector including a first sector selection transistor and a first plurality of pages connected to the first sector selection transistor, and a second sector including a second sector selection transistor and a second plurality of pages connected to the second sector selection transistor. Each of the first and second plurality of pages includes a memory transistor and a selection transistor, and a number of pages in the first plurality of pages is greater than a number of pages in the second plurality of pages.

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation of and claims priority under 35U.S.C. §§120/121 to U.S. patent application Ser. No. 13/177,873, filedon Jul. 7, 2011, which claims priority under 35 U.S.C. §119 to KoreanPatent Application No. 10-2010-0097831 filed on Oct. 7, 2010 in theKorean Intellectual Property Office (KIPO), the entire contents of eachof which are incorporated herein by reference.

BACKGROUND

1. Field

At least some example embodiments relate to a non-volatile memorydevice.

2. Description of the Related Art

Semiconductor memory devices may be largely classified into volatilememory devices and non-volatile memory devices. The volatile memorydevices can perform data read/write operations quickly, but they losedata when an external power supply is interrupted. On the other hand,the non-volatile memory devices can store data even when the externalpower supply is interrupted. Accordingly, the non-volatile memorydevices are used to store data regardless of power supply. As examplesof the non-volatile memory devices, there are a mask read-only memory(MROM), a programmable read-only memory (PROM), an erasable programmableread-only memory (EPROM), an electrically erasable programmableread-only memory (EEPROM) and the like.

SUMMARY

At least one example embodiment provides a non-volatile memory devicewith improved reliability.

Other objects of at least some example embodiments will be described inor be apparent from the following description of the embodiments.

According to an aspect of at least one example embodiment, there isprovided a non-volatile memory device including a first sector includinga first sector selection transistor and a first plurality of pagesconnected to the first sector selection transistor; and a second sectorincluding a second sector selection transistor and a second plurality ofpages connected to the second sector selection transistor, wherein eachof the first and second plurality of pages includes a memory transistorand a selection transistor, and a number of pages in the first pluralityof pages is greater than a number of pages in the second plurality ofpages.

According to at least one example embodiment, there is provided anon-volatile memory device including a first sector including a firstsector selection transistor and a first plurality of pages connected tothe first sector selection transistor; a second sector including asecond sector selection transistor and a second plurality pagesconnected to the second sector selection transistor; and a control unitconfigured to apply an enable signal to each of the first and secondpluralities of pages through word lines, wherein the control unit isconfigured to apply the enable signal to only some of the secondplurality pages through the word lines.

According to at least one example embodiment, there is provided anon-volatile memory device including a first sector including a firstsector selection transistor and a first plurality of pages connected tothe first sector selection transistor; a second sector including asecond sector selection transistor and a second plurality of pagesconnected to the second sector selection transistor; a third sectorincluding a third sector selection transistor and a third plurality ofpages connected to the third sector selection transistor; a fourthsector including a fourth sector selection transistor and a fourthplurality of pages connected to the fourth sector selection transistor;and a control unit configured to apply an enable signal to each of thefirst through fourth pluralities of pages through word lines, wherein anumber of pages of the first plurality of pages is equal to a number ofpages of the second plurality of pages, a number of pages of the thirdplurality of pages is equal to a number of pages of the fourth pluralityof pages, the number of the pages of the third sector being smaller thanthe number of the pages of the first sector, and the control unit isconfigured to apply the enable signal to only some of the pages includedin the second and fourth pluralities of pages through the word lines.

According to at least one example embodiment, a memory apparatusincludes a memory device, the memory device including first and secondsectors, each of the first and second sectors including a plurality ofmemory pages, each of the plurality of memory pages including at leastone memory transistor and at least one page selection transistor, and asector selection transistor configured to select pages from among theplurality of pages; and a memory controller configured to selectivelycontrol the memory device to store data in one of the first sector orthe second sector based on whether or not the data is operation data.

Other example embodiments are included in the detailed description anddrawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The above and other features and advantages of example embodiments willbecome more apparent by describing in detail example embodiments withreference to the attached drawings. The accompanying drawings areintended to depict example embodiments and should not be interpreted tolimit the intended scope of the claims. The accompanying drawings arenot to be considered as drawn to scale unless explicitly noted.

FIG. 1 is an exemplary diagram for explaining an overall circuitconfiguration of a non-volatile memory device;

FIGS. 2 and 3 are diagrams for explaining disturbance generated inprogram/erase operations of the non-volatile memory device of FIG. 1;

FIG. 4 is a conceptual diagram of a non-volatile memory device inaccordance with at least one example embodiment;

FIGS. 5 to 7 are conceptual diagrams of non-volatile memory devices inaccordance with modification examples of at least one exampleembodiment;

FIG. 8 is a conceptual diagram of a non-volatile memory device inaccordance with at least one example embodiment;

FIG. 9 is a conceptual diagram of a non-volatile memory device inaccordance with a modification example of at least one exampleembodiment; and

FIGS. 10 to 12 are diagrams for explaining an application example of thenon-volatile memory device fabricated in accordance with at least oneexample embodiment.

DETAILED DESCRIPTION

Detailed example embodiments are disclosed herein. However, specificstructural and functional details disclosed herein are merelyrepresentative for purposes of describing example embodiments. Exampleembodiments may, however, be embodied in many alternate forms and shouldnot be construed as limited to only the embodiments set forth herein.

Accordingly, while example embodiments are capable of variousmodifications and alternative forms, embodiments thereof are shown byway of example in the drawings and will herein be described in detail.It should be understood, however, that there is no intent to limitexample embodiments to the particular forms disclosed, but to thecontrary, example embodiments are to cover all modifications,equivalents, and alternatives falling within the scope of exampleembodiments. Like numbers refer to like elements throughout thedescription of the figures.

It will be understood that, although the terms first, second, etc. maybe used herein to describe various elements, these elements should notbe limited by these terms. These terms are only used to distinguish oneelement from another. For example, a first element could be termed asecond element, and, similarly, a second element could be termed a firstelement, without departing from the scope of example embodiments. Asused herein, the term “and/or” includes any and all combinations of oneor more of the associated listed items.

It will be understood that when an element is referred to as being“connected” or “coupled” to another element, it may be directlyconnected or coupled to the other element or intervening elements may bepresent. In contrast, when an element is referred to as being “directlyconnected” or “directly coupled” to another element, there are nointervening elements present. Other words used to describe therelationship between elements should be interpreted in a like fashion(e.g., “between” versus “directly between”, “adjacent” versus “directlyadjacent”, etc.).

The terminology used herein is for the purpose of describing particularembodiments only and is not intended to be limiting of exampleembodiments. As used herein, the singular forms “a”, “an” and “the” areintended to include the plural forms as well, unless the context clearlyindicates otherwise. It will be further understood that the terms“comprises”, “comprising,”, “includes” and/or “including”, when usedherein, specify the presence of stated features, integers, steps,operations, elements, and/or components, but do not preclude thepresence or addition of one or more other features, integers, steps,operations, elements, components, and/or groups thereof.

It should also be noted that in some alternative implementations, thefunctions/acts noted may occur out of the order noted in the figures.For example, two figures shown in succession may in fact be executedsubstantially concurrently or may sometimes be executed in the reverseorder, depending upon the functionality/acts involved.

Hereinafter, non-volatile memory devices in accordance with at least oneexample embodiment and modification examples thereof will be describedwith reference to FIGS. 1 to 7.

FIG. 1 is an exemplary diagram for explaining an overall circuitconfiguration of a non-volatile memory device. FIGS. 2 and 3 arediagrams for explaining disturbance generated in program/eraseoperations of the non-volatile memory device of FIG. 1. FIG. 4 is aconceptual diagram of a non-volatile memory device in accordance with atleast one example embodiment. FIGS. 5 to 7 are conceptual diagrams ofnon-volatile memory devices in accordance with modification examples ofat least one example embodiment.

Although a two-transistor (2T)-Fowler-Nordheim (FN)-NOR memory isdescribed as an example of a non-volatile memory device in at least oneexample embodiment, at least some example embodiments are not limitedthereto.

FIG. 1 illustrates an exemplary array structure of a 2T-FN-NOR memorycapable of performing switching between K pages using one sectorselection transistor SST1 or SST2. Herein, “page” means a unitconfigured as a memory transistor MT and a selection transistor STconnected in series to the memory transistor MT.

The memory transistor MT forming a page is a substantially data storageelement, which may include a floating gate serving as a charge storageregion. Each page may be programmed by injecting electric charges in thefloating gate by Fowler-Nordheim (F-N) tunneling, and erased bydischarging the electric charges injected in the floating gate by F-Ntunneling. The floating gate may be configured as a single gate or stackgate. A control gate may be formed on the floating gate. The controlgates of the memory transistors MT arranged at the same page positionmay be connected in common to a selection line SL. Meanwhile, theselection transistor ST may include a selection gate to controlactivation of the memory transistor MT corresponding to the selectiontransistor ST. The selection gates of the selection transistors STaligned in the same page line may be connected in common to thecorresponding one of word lines WL0 to WL(K-1).

In this case, the sector may be enabled by one sector selectiontransistor SST1 or SST2, and include a plurality of pages connected tothe sector selection transistor SST1 or SST2. In other words, referringto FIG. 1, a first sector Sector1 may be enabled by a first sectorselection transistor SST1, and include a plurality of pages connected inseries to the first sector selection transistor SST1. Further, a secondsector Sector2 may be enabled by a second sector selection transistorSST2, and include a plurality of pages connected in series to the secondsector selection transistor SST2.

The sector selection transistor SST1 (or SST2) may be controlled by asector selection gate SSG, and serve to provide a signal of a bit lineBL0 (or BL1) to the pages forming the sector Sector1 (or Sector2). Forexample, if the first sector selection transistor SST1 is turned on bythe sector selection gate SSG, a signal of the bit line BL0 may beapplied to the pages included in the first sector Sector1 such that thefirst sector Sector1 is enabled.

Meanwhile, a common source line CS may be connected to a source of theselection transistor ST. Further, a local bit line branched from thesector selection transistor SST1 or SST2 may be connected to a drain ofthe memory transistor MT. Although not shown, an additional transistor(not shown) connecting the selection line SL with a global control lineGCL may be provided so as to program all pages in a first well PPW.

Next, a case of programming a specific page (represented by “Page” inFIG. 1) will be described with reference to FIGS. 1 and 2. In order toprogram the specific page by F-N tunneling, the following operations maybe performed on those associated with the specific page: a voltage pVnnh(e.g., −5 V) is applied to a bit line BL(n-1), a voltage pVnnh (e.g., −5V) is applied to the first well PPW of FIG. 1, a voltage pVnnh (e.g., 11V) is applied to the selection line SL, a voltage pVnnh (e.g., −5 V) isapplied to the word line WL0, and a source of the selection transistorST is made to be in a floating state. In this case, electrons of achannel formed in the first well PPW are injected in the floating gateby F-N tunneling, thereby programming the specific page.

In this case, in order to prevent other pages from being programmed, thefollowing operations may be performed on those which are not associatedwith the specific page: a ground voltage (e.g., 0 V) is applied to bitlines BL0 to BL(n-2) (represented by reference numeral 30 of FIG. 2) andthe selection line SL, a voltage pVnnh (e.g., −5 V) is applied to thefirst well PPW of FIG. 1 (represented by reference numeral 10 of FIG.2), a voltage pVnnh (e.g., −5 V) is applied to word lines WL1 toWL(k-1), and a source (represented by reference numeral 20 of FIG. 2) ofthe selection transistor ST is made to be in a floating state. In thiscase, in pages included in a region A of FIG. 1 which should not beprogrammed, electrons are injected in the floating gate due to a voltagedifference between the first well 10 and the selection line SL as shownin FIG. 2, thereby causing program disturbance.

Next, a case of erasing a specific page (represented by “Page” inFIG. 1) will be described with reference to FIGS. 1 and 3. In order toerase the specific page by F-N tunneling, the following operations maybe performed on those associated with the specific page: the bit lineBL(n-1) and the source of the selection transistor ST are made to be ina floating state, a voltage eVnnh (e.g., 10 V) is applied to the firstwell PPW of FIG. 1, a voltage eVnnh (e.g., −6 V) is applied to theselection line SL, and a voltage eVnnm (e.g., 6 V) is applied to theword line WL0. In this case, electrons injected in the floating gateflow into the channel formed in the first well PPW, thereby erasing thespecific page.

In this case, in order to prevent other pages from being erased, thefollowing operations may be performed on those which are not associatedwith the specific page: the bit lines BL0 to BL(n-2) (represented byreference numeral 30 of FIG. 3) and the source (represented by referencenumeral 20 of FIG. 3) of the selection transistor ST are made to be in afloating state, a voltage eVnnh (e.g., 10 V) is applied to the firstwell PPW of FIG. 1 (represented by reference numeral 10 of FIG. 3), anda voltage eVnnm (e.g., 6 V) is applied to the selection line SL. In thiscase, in pages included in the first well PPW of FIG. 1 which should notbe erased, electrons are emitted from the floating gate due to a voltagedifference between the first well 10 and the selection line SL as shownin FIG. 3, thereby causing erase disturbance.

When the program disturbance and the erase disturbance frequently occurdue to repeated program/erase operations, it may have a bad influence onthe reliability of the non-volatile memory device. For instance, if aspecific sector is a sector storing code data, since the code data maynot require frequent program/erase operations due to the nature of thecode data, the program/erase disturbance may not frequently occur.However, if a specific sector is a sector storing operation data, sincethe operation data may require frequent program/erase operations due tothe nature of the operation data, the program/erase disturbancefrequently occurs, and it may have a bad influence on the reliability ofthe non-volatile memory device.

Referring to FIG. 4, the non-volatile memory device in accordance withat least one example embodiment may include the first sector Sector1which is enabled by the first sector selection transistor SST1 and has aplurality of pages connected to the first sector selection transistorSST1, and the second sector Sector2 which is enabled by the secondsector selection transistor SST2 and has a plurality of pages connectedto the second sector selection transistor SST2. In this case, each pagemay include the memory transistor and the selection transistor asdescribed above, and the first sector Sector 1 and the second sectorSector2 may be formed in the same well, i.e., the first well PPW.Further, the first and second sector selection transistors SST1 and SST2may be enabled according to a signal of the sector selection gate SSG.

Meanwhile, the number of pages of the first sector Sector1 may begreater than the number of pages of the second sector Sector2.Specifically, as shown in FIG. 4, the number of pages of the firstsector Sector1 may be, e.g., K, and the number of pages of the secondsector Sector2 may be, e.g., function ƒ(K/X) where ƒ(A) is a maximumvalue among natural numbers smaller than A; and X is less than K andgreater than 1. Also, X may be adjusted by a user if necessary. K and Xmay be, for example, positive integers.

In the non-volatile memory device in accordance with at least oneexample embodiment, the first sector Sector1 may be a sector storing thecode data, and the second sector Sector2 may be a sector storing theoperation data. That is, it is possible to minimize the programdisturbance by reducing the number of pages of the second sector Sector2in which the program operation frequently occurs, thereby improving thereliability of the non-volatile memory device.

Next, referring to FIG. 5, a non-volatile memory device in accordancewith a first modification example of at least one example embodiment mayfurther include a control unit which applies an enable signal to eachpage through the word lines WL.

The control unit may apply an enable signal to only some of pagesincluded in the second sector Sector2 through the word lines WL.Accordingly, a signal of the word lines WL may be applied to only someof [K/X] pages. That is, an enable signal is not applied through theword line WL to the nearest page to the second sector selectiontransistor SST2 among the pages of the second sector Sector2 of FIG. 5and, thus, the page is not used (see “X” represented in FIG. 5). On theother hand, an enable signal is applied through the word line WL to thenext page and, thus, the page is used (see “O” represented in FIG. 5).In other words, the control unit may apply an enable signal so as to useonly some pages among [K/X] pages of the second sector Sector2. Theoperation of the control unit may be performed by a previouslyprogrammed logic (not shown). Alternatively, the control unit may beprovided with a page counter (not shown) such that a specific page isnot used if the number of program operations performed on the specificpage is equal to or larger than a predetermined value.

As described above, in a case where the non-volatile memory devicefurther includes the control unit, it is possible to more efficientlyreduce the program disturbance than the non-volatile memory device inaccordance with at least one example embodiment, thereby enhancing thereliability of the non-volatile memory device.

Next, referring to FIG. 6, a non-volatile memory device in accordancewith a second modification example of at least one example embodimentmay further include a plurality of fuses F connected to the word linesWL. In this case, the control unit does not control the operations ofpages and whether to use a specific page may be determined by the fusesF connected to the word lines WL. Specifically, referring to FIG. 6,although the control unit is set to use all pages of the first andsecond sectors Sector1 and Sector2 (see “O” represented in FIG. 6), atleast one of the fuses F, which are connected through the word lines WLto some of the pages included in the second sector Sector2, is cut off.Accordingly, the page, to which a signal is not applied through the wordline WL because the fuse F is cut off, cannot be used as a memory. Thus,only some pages among [K/X] pages included in the second sector Sector2are used.

Although the control unit is set to use all pages in the example of FIG.6, the first modification example and the second modification examplecan be combined with each other. That is, in the second sector Sector2,some pages may be controlled by using the control unit and some pagesmay be controlled by using the fuses F. Although not shown in thedrawings, the non-volatile memory device may further include a thirdsector (not shown) which is enabled by a third sector selectiontransistor (not shown) and has a plurality of pages connected to thethird sector selection transistor, and the number of pages of the thirdsector (not shown) may be [K/X] equal to the number of pages of thesecond sector Sector2. In this case, some pages among the [K/X] pagesincluded in the second sector Sector2 are used by the control unit orthe fuses F, whereas all of the [K/X] pages included in the third sectorSector3 may be used. In this case, all of K pages of the first sectorSector1 may be used, some pages among [K/X] pages of the second sectorSector2 may be used, and all of [K/X] pages of the third sector (notshown) may be used.

Next, referring to FIG. 7, a non-volatile memory device in accordancewith a third modification example of at least one example embodiment mayinclude a first sector Sector1 and a second sector Sector2 which areformed in different wells. That is, as shown in FIG. 7, the first sectorSector1 may be formed in a first well PPW1 and the second sector Sector2may be formed in a second well PPW2. When the first sector Sector1 andthe second sector Sector2 are formed in different wells, the erasedisturbance can be reduced. Specifically, the second sector Sector2 is asector storing operation data, in which the erase operation mayfrequently occur. On the other hand, the first sector Sector1 is asector storing code data, in which the erase operation does notfrequently occur. Accordingly, when the first sector Sector1 and thesecond sector Sector2 are formed in different wells, it is possible toreduce the disturbance which the first sector Sector1 undergoes from thefrequent erase operations of the second sector Sector2.

In the same way as the above, all of the embodiment and modificationexamples can be variously combined with each other. Since those skilledin the art can understand this from the above description, a descriptionof specific and detailed combinations will be omitted.

Next, non-volatile memory devices in accordance with at least oneexample embodiment and a modification example thereof will be describedwith reference to FIGS. 8 and 9.

FIG. 8 is a conceptual diagram of a non-volatile memory device inaccordance with at least one example embodiment. FIG. 9 is a conceptualdiagram of a non-volatile memory device in accordance with amodification example of at least one example embodiment. For convenienceof explanation, only differences from the above embodiment will bedescribed and a repeated description will be omitted.

Referring to FIG. 8, the non-volatile memory device in accordance withat least one example embodiment includes the first sector Sector1 andthe second sector Sector2, each sector having K pages. Further, thecontrol unit controls a signal of the word lines WL so as to use onlysome pages among K pages of the second sector Sector2 (see “O” and “X”represented in FIG. 8). Accordingly, the second sector Sector2 has Kpages, but only some pages of the K pages are used. In this case, areduction of program disturbance of the non-volatile memory device isdescribed in detail above and, thus, a repeated description thereof willbe omitted.

Next, referring to FIG. 9, a non-volatile memory device in accordancewith a modification example of at least one example embodiment includesthe first sector Sector1 and the second sector Sector2 which are formedin different wells PPW1 and PPW2. In this case, a reduction of programdisturbance of the non-volatile memory device is described in detailabove and, thus, a repeated description thereof will be omitted.

In the same way as the above, all of the embodiments and modificationexamples can be variously combined with each other. For instance, anon-volatile memory device in accordance with at least one exampleembodiment may include a first sector which is enabled by a first sectorselection transistor and has a plurality of pages connected to the firstsector selection transistor, a second sector which is enabled by asecond sector selection transistor and has a plurality of pagesconnected to the second sector selection transistor, a third sectorwhich is enabled by a third sector selection transistor and has aplurality of pages connected to the third sector selection transistor, afourth sector which is enabled by a fourth sector selection transistorand has a plurality of pages connected to the fourth sector selectiontransistor, and a control unit which applies an enable signal to eachpage through word lines, wherein the first sector and the second sectorhave the same number (i.e., K) of pages, the third sector and the fourthsector have the same number of (i.e., [K/X]) of pages, and the controlunit applies an enable signal to only some pages among the pagesincluded in the second and fourth sectors through the word lines.

Next, an application example of the non-volatile memory devicefabricated in accordance with at least one example embodiment will bedescribed with reference to FIGS. 10 to 12.

FIGS. 10 to 12 are diagrams for explaining an application example of thenon-volatile memory device fabricated in accordance with at least oneexample embodiment. In the examples illustrated in FIGS. 10-12, a memory510 may be a non-volatile memory device fabricated in accordance withany one aforementioned example embodiments, including the exampleembodiments referenced with respect to FIGS. 1 and 4-9 which aredirected to memory devices that may provide improved reliability asdescribed above.

Referring to FIG. 10, a system in accordance with at least one exampleembodiment includes a memory 510 and a memory controller 520 connectedto the memory 510. The memory controller 520 may provide an input signalfor controlling an operation of the memory 510, e.g., a command signaland an address signal for controlling a read operation and a writeoperation, to the memory 510. Further the memory controller 520 may beconfigured such that operation data is stored in Sector 2 of the memory510 and non-operation data, e.g. coding data, is stored in Sector 1 ofthe memory 510.

The system including the memory 510 and the memory controller 520 may beembodied in a card such as a memory card. Specifically, the system inaccordance with at least one example embodiment may be embodied in acard which satisfies a specified industry standard and is used in anelectronic device such as a mobile phone, a two-way communicationsystem, a one-way pager, a two-way pager, a personal communicationsystem, a portable computer, a personal data assistant (PDA), an audioand/or video player, a digital and/or video camera, a navigation system,a global positioning system (GPS), and the like. However, it is notlimited thereto, and the system in accordance with at least one exampleembodiment may be embodied in various forms such as a memory stick.

Referring to FIG. 11, a system in accordance with at least one exampleembodiment may include a memory 510, a memory controller 520, and a hostsystem 530. In this case, the host system 530 may be connected to thememory controller 520 via a bus and the like, and provide a controlsignal to the memory controller 520, so that the memory controller 520can control an operation of the memory 510. The host system 530 may be,for example, a processing system used in a mobile phone, a two-way radiocommunication system, a one-way pager, a two-way pager, a personalcommunication system, a portable computer, a PDA, an audio and/or videoplayer, a digital and/or video camera, a navigation system, a GPS, andthe like.

Meanwhile, although the memory controller 520 is interposed between thememory 510 and the host system 530 in FIG. 11, it is not limitedthereto, and the memory controller 520 may be selectively omitted in asystem in accordance with at least one example embodiment. Further oneor both of the host system 530 and the memory controller 520 may beconfigured such that operation data is stored in Sector 2 of the memory510 and non-operation data, e.g. coding data, is stored in Sector 1 ofthe memory 510. Further the host system 530 is capable of indicating tothe memory controller 520 whether data to be stored in the memory 510 isoperation data or non-operation data.

Referring to FIG. 12, a system in accordance with at least one exampleembodiment may be a computer system 560 including a central processingunit (CPU) 540 and a memory 510. In the computer system 560, the memory510 may be connected to the CPU 540 directly or using a typical computerbus architecture. The memory 510 may store an operation system (OS)instruction set, a basic input/output start up (BIOS) instruction set,an advanced configuration and power interface (ACPI) instruction set andthe like, or may be used as a large-capacity storage device such as asolid state disk (SSD).

For convenience of explanation, all constituent elements included in thecomputer system 560 are not illustrated in FIG. 12, but it is notlimited thereto. Further, for convenience of explanation, the memorycontroller 520 is omitted between the memory 510 and the CPU 540 in FIG.12. However, the memory controller 520 may be interposed between thememory 510 and the CPU 540 in at least one example embodiment. Furtherone or both of the memory controller 520 and the CPU 540 may beconfigured such that operation data is stored in Sector 2 of the memory510 and non-operation data, e.g. coding data, is stored in Sector 1 ofthe memory 510.

Example embodiments having thus been described, it will be obvious thatthe same may be varied in many ways. Such variations are not to beregarded as a departure from the intended spirit and scope of exampleembodiments, and all such modifications as would be obvious to oneskilled in the art are intended to be included within the scope of thefollowing claims.

1. (canceled)
 2. A non-volatile memory device comprising: a first sectorincluding a first sector selection transistor and a first plurality ofpages connected to the first sector selection transistor; a secondsector including a second sector selection transistor and a secondplurality pages connected to the second sector selection transistor; anda control unit configured to apply an enable signal to each of the firstand second pluralities of pages through word lines, wherein the controlunit is configured to apply the enable signal to only some of the secondplurality pages through the word lines.
 3. The non-volatile memorydevice of claim 2, wherein a number of pages of the first plurality ofpages is equal to a number of pages of the second plurality of pages. 4.The non-volatile memory device of claim 2, wherein the first sector is asector storing code data, and the second sector is a sector storingoperation data.
 5. The non-volatile memory device of claim 2, wherein anumber of pages of the first plurality of pages is greater than a numberof pages of the second plurality of pages.
 6. The non-volatile memorydevice of claim 2, wherein the first sector and the second sector areformed in a first well.
 7. The non-volatile memory device of claim 2,wherein the first sector is formed in a first well, and the secondsector is formed in a second well different from the first well.